New HIL Simulators reduce development and test risk without compromising needed flexibility by building on open, commercial off-the-shelf platforms. NI, announced turnkey HIL Simulators built on an open, modular architecture to help automotive and aerospace embedded software testers maintain quality while handling the demands of shortened schedules, constantly changing test requirements and reduced manpower. NI […]
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NI Brings Semiconductor ATE Digital Capability to PXI
Digital instrument delivers hardware and software features needed for smarter semiconductor test system development. NI, announced the NI PXIe-6570 digital pattern instrument and NI Digital Pattern Editor. This product frees manufacturers of RFICs, power management ICs, MEMS devices and mixed-signal ICs from the closed architectures of conventional semiconductor automated test equipment. The requirements of the […]
LabVIEW 2016 New Channel Wires simplify development and improve productivity
Latest version of LabVIEW features 500+ new supported instruments, 5 new 64-bit add-ons, supports improved Python integration. National Instruments (NI), announced the LabVIEW 2016 system design software, empowering engineers to simplify development and effectively integrate software from the ecosystem into their systems. The latest version of LabVIEW introduces new channel wires to simplify complex communication […]
